Application Case: ChipDAQ 1PC Applied to Heat Resistance Flow Test Equipment with Quartz Lamp Heating

1. Project Overview

This test device adopts short-wave quartz infrared lamps as radiant heat sources to test the transient heat flow resistance of composite and polymer materials. The process requires the heat flux density to reach 400kW/㎡ or even 500kW/㎡ within 5 seconds, with a constant heating rate and zero overshoot in heat flow output, so as to accurately measure the thermal deformation and thermal failure threshold of materials.

Conventional temperature controllers suffer from sampling delays and slow PID response, leading to severe overshoot of instantaneous radiant heat flow from quartz lamps, drastic fluctuations in heat flow curves, poor repeatability of experimental data, and failure to meet testing standards.

2. Control Challenges

Quartz lamps feature ultra-low thermal inertia and generate intense radiant heat flow immediately after power-on. Conventional controllers have slow regulation response, resulting in severe heat flow overshoot.

A fixed heat flow rising slope is mandatory, while traditional fixed-parameter PID cannot dynamically adapt to transient high heat flow working conditions.

Slight heat flow overshoot will cause premature thermal damage to test materials and distort heat resistance test results.

3. Measurement & Control Solution

The ChipDAQ 1PC single-channel high-speed process controller is selected as the core control unit:

Independent single-channel computation and 10ms high-speed sampling capture instantaneous readings from heat flow sensors in real time without polling delay.

Built-in PID algorithm with derivative lead and integral separation anti-windup, together with heating slope limit function, precisely stabilizes the heat flow rising rate.

Matched with JD series SCR power regulators offering high-precision 0.0%~99.9% fast response, the system adjusts quartz lamp power within milliseconds to dynamically balance radiant heat flow.

System signal chain: Heat flow Sensor → ChipDAQ 1PC → JD Series SCR Power Regulator → Quartz Infrared Heating Lamp

4. Actual Application Performance

Process indicators fully achieved: Heat flux density rises uniformly to 400kW/㎡ within 5 seconds with a smooth linear rising curve, fast steady-state entry and zero fluctuation during stable operation.

Excellent test repeatability: Heat flow curves of repeated tests overlap closely, delivering accurate and traceable test data.

Stable anti-interference operation; one-click auto-tuning simplifies commissioning, suitable for transient thermal shock tests of various materials.

5. Solution Summary

For material heat resistance flow testing equipment adopting rapid radiant heating by quartz lamps, ChipDAQ 1PC fulfills strict test requirements of reaching 400kW/㎡ heat flux density in 5 seconds by virtue of high-speed closed-loop response and zero-overshoot intelligent PID algorithm. It eliminates heat flow overshoot and chaotic curve issues common in conventional controllers, providing a reliable single-channel measurement and control solution for material thermal performance testing equipment.

Furthermore, it delivers superior performance in slow-ramp tests with nearly perfectly fitted curves